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All interested parties are invited to contribute to the ongoing development of WK11541 , Specification for Structural Insulated Panel (SIP) Adhesives for Bonding Oriented Strand Board (OSB) Facers to Rigid Cellular Polystyrene Thermal Insulation Core Materials. The proposed standard is under the jurisdiction of Subcommittee D14.70 on Construction Adhesives, which is part of ASTM International…
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A new ASTM International standard, D 7247 , Test Method for Evaluating the Shear Strength of Adhesive Bonds in Laminated Wood Products at Elevated Temperature, will be an important new tool for anyone working with engineered wood products. The proposal for D 7247 originated in Committee D07 on Wood and members of both that committee and Committee D14 on Adhesives worked together to develop it.…
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ASTM International Committee E12 on Color and Appearance will present an exciting seminar on Imaging Photometry on June 16, 2005, in Reno, Nev. from 3:15 - 5:00 p.m. during the E12.06 subcommittee meeting. The presentation, titled "Introduction to Imaging Photometry and Radiant Imaging, Inc." will present imaging photometry and colorimetry discussing the advantages and challenges of light and…
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ASTM International Committee E12 on Color and Appearance, presents an exciting seminar on Imaging Photometry on June 16, 2005, in Reno, Nev., from 3:15 - 5:00 p.m. during the E12.06 subcommittee meeting. The presentation entitled, "Introduction to Imaging Photometry and Radiant Imaging, Inc." will present imaging photometry and colorimetry discussing the advantages and challenges of light and…, C, O, L, O, R, Science Consultancy, 215/369-5005, jack.ladson@verizon.net
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ASTM International Committee E42 on Surface Analysis has approved a new standard, E 2382, Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy. The guide, under the jurisdiction of Subcommittee E42.14 on STM/AFM, was proposed in order to assist new scanning probe microscopy users with more rapid recognition and assessment of artifacts in imaging…