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A new standard will help test technology that is used in many electronic devices. According to ASTM members Lin Tingyu (National Center for Advanced Packaging) and Hi Jinjiang (Grikin Advanced Materials Co. Ltd.), the new standard will provide a baseline of quality, reliability, and process for manufacturers of “sputtering targets,” which are often used for thin-film deposition, etching, and…, ASTM Committee F01 on Electronics Next Meeting:, January 31, 2017, January Committee Week, Norfolk, Va., Media Inquiries:, Dan Bergels, tel +1.610.832.9602; dbergels@astm.org, Technical Contact:, Lin Tingyu, National Center for Advanced Packaging, Wuxi, Jiangsu province, China, tel +1.535.805.3318; tingyulin@ncp-cn.com, ASTM Staff Contact:, Kelly Paul, tel +1.610.832.9745; kpaul@astm.org Release #10163
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Kristen Duda, student at the University of Pennsylvania, Philadelphia, Pennsylvania, USA has received the Mary R. Norton Memorial Scholarship for Women Award from ASTM Committee E04 on Metallography. The committee noted Duda’s demonstrated ability, evident potential, and career goals in the material science industry. Duda previously served as a material technologies intern at Air Products, Exton…, Media Inquiries:, Dan Bergels, tel +1.610.832.9602; dbergels@astm.org Release #10139
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A continuing interest among road authorities to improve highway safety has led to efforts to improve wet-night visibility of pavement markings, including a new ASTM International standard. ASTM E2832 , Test Method for Measuring the Coefficient of Retroreflected Luminance of Pavement Markings in a Standard Condition of Continuous Wetting (RL-2), was developed by Subcommittee E12.10 on…, ASTM Committee E12 Next Meeting:, Jan. 30-31, 2013, January committee week, Jacksonville, Fla., Technical Contact:, Paul Carlson, Texas Transportation Institute, College Station, Texas, Phone: 979-845-6004; paul-carlson@tamu.edu, ASTM Staff Contact:, Thomas O’Toole, Phone: 610-832-9739; totoole@astm.org, ASTM PR Contact:, Barbara Schindler, Phone: 610-832-9603; bschindl@astm.org R elease #9243
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ASTM grain size is a property written into many specifications for metals, with finer grain sizes generally indicating better mechanical properties, such as formability. While measuring certain materials for such properties can be difficult, electron backscatter diffraction can provide precise determinations as well as give information on grain size distribution and statistics. A new ASTM…
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A recent revision to ASTM International standard E384 , Test Method for Knoop and Vickers Hardness of Materials, expands the range of its coverage. The standard is under the jurisdiction of Subcommittee E04.05 on Microindentation Hardness Testing, part of ASTM International Committee E04 on Metallography. The revision incorporates ASTM E92 , Test Method for Vickers Hardness of Metallic Materials…
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A request from the United States Navy was the impetus behind the development of a new ASTM International standard, E2630 , Test Method for Luminance Ratio of a Fluorescent Specimen Using a Narrow Band Source. The new standard was developed by Subcommittee E12.05 on Fluorescence, part of ASTM International Committee E12 on Color and Appearance. Richard Harold, consultant, Color and Appearance…
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First generation gonioapparent colorants are materials pigmented with metal flakes that change lightness as illumination angles change. Used heavily in automotive coatings, the first generation of gonioapparent materials was covered by ASTM International standard E2194 , Practice for Multiangle Color Measurement of Metal Flake Pigmented Materials, first published in 2003. Now, a second generation…
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ASTM International Committee E12 on Color and Appearance has approved a new standard that describes techniques for planning and analyzing the results of an interlaboratory study conducted for certain test methods within E12. E 2480 , Practice for Conducting an Interlaboratory Study to Determine the Precision of a Test Method with Multi-Valued Measurands, is under the jurisdiction of Subcommittee…
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A proposed new standard currently being developed by ASTM International Committee F01 on Electronics will prove to be useful to the tantalum sputtering target industry. The proposed standard, WK9490, Test Method for Reporting Crystallographic Orientation of Sputtering Target Materials, is under the jurisdiction of Subcommittee F01.17 on Sputter Metallization. "The tantalum sputtering target…
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ASTM International Committee F01 on Electronics is currently developing a proposed new standard that will provide uniformity in the values reported for oxygen content in aluminum alloys used for sputtering targets in the manufacture of integrated circuits. The proposed standard, WK9120, Determination of Oxygen in High Purity Aluminum and Alloys in High Purity Aluminum Base by Inert Gas Fusion…