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ASTM International Committee E07 on Nondestructive Testing has initiated work on a proposed new Guide for Digital Detector Array Selection. Information on the proposed guide, which is under the jurisdiction of Subcommittee E07.01 on Radiology (X and Gamma) Method, can be found by entering "WK7492" in the site search box on the home page of ASTM Internationals Web site ( www.astm.org ). The…
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ASTM International Committee E42 on Surface Analysis has approved a new standard, E 2382, Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy. The guide, under the jurisdiction of Subcommittee E42.14 on STM/AFM, was proposed in order to assist new scanning probe microscopy users with more rapid recognition and assessment of artifacts in imaging…