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ASTM International Committee E42 on Surface Analysis has approved a new standard, E 2382, Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy. The guide, under the jurisdiction of Subcommittee E42.14 on STM/AFM, was proposed in order to assist new scanning probe microscopy users with more rapid recognition and assessment of artifacts in imaging…
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ASTM International Subcommittee F04.35 has recently undergone a name change. Formerly known as F04.35 on GI Endoscopes, the subcommittee, which is under the jurisdiction of Committee F04 on Medical and Surgical Materials and Devices, is now known as Gastroenterolgy (GI). The name change indicates a broadening of the scope of activities for the subcommittee. James Bardwell, Leading Medical…