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Sieve manufacturers produce testing sieves using various sizes of wire cloth, per ASTM International standard E 11, Specification for Wire Cloth and Sieves for Testing Purposes. They also use ASTM standards E 161, Specification for Precision Electroformed Sieves, and E 323, Specification for Perforated-Plate Sieves for Testing Purposes when producing sieves from perforated plate. These…
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ASTM International Committee E42 on Surface Analysis has approved a new standard, E 2382, Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy. The guide, under the jurisdiction of Subcommittee E42.14 on STM/AFM, was proposed in order to assist new scanning probe microscopy users with more rapid recognition and assessment of artifacts in imaging…