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No industry standard currently exists that addresses the vacuum sealing requirements of knife-edged flanges for high vacuum applications. Existing international standards focus on interchangeability of the hardware, but do not address the reliability of the seal. ASTM International Committee E42 on Surface Analysis is now working on a proposed standard on the subject, WK21206 , Specification…
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A 2002 workshop on galling wear held by ASTM International Committee G02 on Wear and Erosion provided the impetus for the development of a new standard, ASTM G196 , Test Method for Galling Resistance of Material Couples. The new standard is under the jurisdiction of Subcommittee G02.40 on Non-Abrasive Wear. According to Scott Hummel, Ph.D., associate professor, head of the department of…
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ASTM Committee E60 to Develop Standards That Will Drive Mainstream Market Implementation ASTM International, one of the largest voluntary standards development organizations in the world, today announced the formation of ASTM Committee E60 on Sustainability. This new standards development initiative results from the cooperative efforts of the U.S. Environmental Protection Agency (EPA) and cross…
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A proposed new standard is being developed for the industrial radiation processing industry and irradiation research facilities where absorbed-dose measurement is critical. The proposed standard, WK15409 , Practice for Dosimetry in Radiation Processing, is under the jurisdiction of Subcommittee E10.01 on Radiation Processing: Dosimetry and Applications, which is part of ASTM International…
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Questions raised at a dosimetry symposium in 1998 have led to the development of a proposed new ASTM International standard, WK13464 , Guide for Performance Characterization of Dosimeters for Use in Radiation Processing. WK13464 is under the jurisdiction of Subcommittee E10.01 on Radiation Processing: Dosimetry and Applications, part of ASTM International Committee E10 on Nuclear Technology and…
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ASTM International Committee E42 on Surface Analysis has approved a new standard, E 2382, Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy. The guide, under the jurisdiction of Subcommittee E42.14 on STM/AFM, was proposed in order to assist new scanning probe microscopy users with more rapid recognition and assessment of artifacts in imaging…