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Manufacturers of toluene, mixed xylenes and p-xylene are often required to determine the type and amount of impurities that remain from manufacture. A new ASTM International standard, D7504 , Test Method for Trace Impurities in Monocyclic Aromatic Hydrocarbons by Gas Chromatography and Effective Carbon Number, can now be used as an internal quality control tool where these products are produced…
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No industry standard currently exists that addresses the vacuum sealing requirements of knife-edged flanges for high vacuum applications. Existing international standards focus on interchangeability of the hardware, but do not address the reliability of the seal. ASTM International Committee E42 on Surface Analysis is now working on a proposed standard on the subject, WK21206 , Specification…
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A 2002 workshop on galling wear held by ASTM International Committee G02 on Wear and Erosion provided the impetus for the development of a new standard, ASTM G196 , Test Method for Galling Resistance of Material Couples. The new standard is under the jurisdiction of Subcommittee G02.40 on Non-Abrasive Wear. According to Scott Hummel, Ph.D., associate professor, head of the department of…
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Chemical plants and contract and research laboratories will all be likely users of a new ASTM International standard, D 7183 , Test Method for Determination of Total Sulfur in Aromatic Hydrocarbons and Related Chemicals by Ultraviolet Fluorescence. D 7183 was developed by Subcommittee D16.04 on Instrumental Analysis, part of ASTM International Committee D16 on Aromatic Hydrocarbons and Related…
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ASTM International standard D 1555, Test Method for Calculation of Volume and Weight of Industrial Aromatic Hydrocarbons and Cyclohexane, and its metric equivalent, D 1555M, have been revised by Committee D16 on Aromatic Hydrocarbons and Related Chemicals. The revision affects the basis for correcting volume from any temperature to 60 F (or 15 C using D 1555M), as well as calculating the weight…
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ASTM International Committee E42 on Surface Analysis has approved a new standard, E 2382, Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy. The guide, under the jurisdiction of Subcommittee E42.14 on STM/AFM, was proposed in order to assist new scanning probe microscopy users with more rapid recognition and assessment of artifacts in imaging…