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ASTM International Committee D10 on Packaging is currently inviting all interested parties to join a new D10 subcommittee, D10.97 on University Liaison. According to S. Paul Singh, professor, school of packaging, Michigan State University, and chair of D10’s division I, the purpose of the new subcommittee is twofold. “We want to allow university programs that teach and research in packaging to be…
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ASTM International Committee F16 on Fasteners has recently approved an important new standard that deals with coated threaded fasteners and washers by hot-dip zinc galvanizing. The standard, F 2329, Specification for Zinc Coating, Hot-Dip, Requirements for Application to Carbon and Alloy Steel Bolts, Screws, Washers, Nuts and Special Threaded Fasteners, is under the jurisdiction of Subcommittee…
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Sieve manufacturers produce testing sieves using various sizes of wire cloth, per ASTM International standard E 11, Specification for Wire Cloth and Sieves for Testing Purposes. They also use ASTM standards E 161, Specification for Precision Electroformed Sieves, and E 323, Specification for Perforated-Plate Sieves for Testing Purposes when producing sieves from perforated plate. These…
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ASTM International Committee F16 on Fasteners has developed a new standard, F 2329, Specification for Zinc Coating, Hot-Dip, Requirements for Application to Carbon and Alloy Steel Bolts, Screws, Washers, Nuts, and Special Threaded Fasteners. The standard, which is under the jurisdiction of Subcommittee F16.03 on Coatings on Fasteners, covers the requirements for hot-dip zinc coating applied to…
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ASTM International Committee D10 on Packaging has formed a new task group to investigate the possibilities of radio frequency identification (RFID) as a means of tracking packages. The task group is under the jurisdiction of Subcommittee D10.18 on Miscellaneous Packaging. The purpose of the task group is to develop standards to evaluate the performance of RFID tags used on packaging and…
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ASTM International Committee E42 on Surface Analysis has approved a new standard, E 2382, Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy. The guide, under the jurisdiction of Subcommittee E42.14 on STM/AFM, was proposed in order to assist new scanning probe microscopy users with more rapid recognition and assessment of artifacts in imaging…