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ASTM International Committee E42 on Surface Analysis has approved a new standard, E 2382, Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy. The guide, under the jurisdiction of Subcommittee E42.14 on STM/AFM, was proposed in order to assist new scanning probe microscopy users with more rapid recognition and assessment of artifacts in imaging…
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ASTM International Subcommittee E06.77 on High Rise Building External Evacuation Devices initiated activity at the October 2004 meeting of Committee E06 on Performance of Buildings, by establishing the following three task groups: Platform Devices - Development of specifications for high-rise external platform devices for evacuation of persons when the primary evacuation routes to a safe zone are…