Search
Advanced search
Filter by category
Filter by committee
Search results
-
A 2002 workshop on galling wear held by ASTM International Committee G02 on Wear and Erosion provided the impetus for the development of a new standard, ASTM G196 , Test Method for Galling Resistance of Material Couples. The new standard is under the jurisdiction of Subcommittee G02.40 on Non-Abrasive Wear. According to Scott Hummel, Ph.D., associate professor, head of the department of…
-
Verifying the results of application software used to calculate the mechanical properties of materials is the subject of a new standard developed by ASTM International Committee E08 on Fatigue and Fracture. The new standard, E 2443, Guide for Verifying Computer-Generated Test Results Through the Use of Standard Data Sets, is under the jurisdiction of Subcommittee E08.03 on Advanced Apparatus and…
-
Many structures, such as aircraft or other lightweight vehicles, are made from thin-ductile structural materials that exhibit low crack-front constraint, which allows for extensive plastic yielding of the material around a crack front. However, many current standards, such as E 399, Test Method for Linear-Elastic Plane-Strain Fracture Toughness K Ic of Metallic Materials, or E 1820, Test Method…
-
Representatives of ASTM International will visit the campus of Southern Methodist University (SMU) in Dallas, Texas, on the evening of Nov. 9, 2005, for an hour-long presentation to university students interested in the field of fatigue and fracture. The session will focus on the technical standards currently in use by this discipline as well as the ability of students and professionals to be…
-
ASTM International Committee E42 on Surface Analysis has approved a new standard, E 2382, Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy. The guide, under the jurisdiction of Subcommittee E42.14 on STM/AFM, was proposed in order to assist new scanning probe microscopy users with more rapid recognition and assessment of artifacts in imaging…