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A new ASTM International standard describes a variety of methods that can be used to determine the index of refraction and dispersion of glass. The standard, C 1648 , Guide for Choosing a Method for Determining the Index of Refraction and Dispersion of Glass, will be useful to manufacturers of glass and glass products as well as designers of products in which glass is a critical component. C 1648…
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ASTM International Committee E42 on Surface Analysis has approved a new standard, E 2382, Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy. The guide, under the jurisdiction of Subcommittee E42.14 on STM/AFM, was proposed in order to assist new scanning probe microscopy users with more rapid recognition and assessment of artifacts in imaging…