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ASTM International has fully redesigned its International Laboratory Directory, the only directory in the world dedicated to helping manufacturers find the right labs to test their products. Independent laboratories throughout the world rely on thousands of standards and test methods, including many developed by ASTM International. By working with these labs, manufacturers can help ensure that…, Contact:, Anna Spektor, tel +1.610.832.9756; aspektor@astm.org, Media Inquiries:, Dan Bergels, tel +1.610.832.9602; dbergels@astm.org Release #10110
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Users of standards involving kinetic parameters need reference materials to qualify individual laboratories and to validate procedures and software. A new ASTM International standard will provide such parameters to accommodate apparatus configurations and kinetic models. ASTM E2781 , Practice for Evaluation of Methods for Determination of Kinetic Parameters by Thermal Analysis, was developed by…, ASTM Committee E27 Next Meeting:, Nov. 15-17, November Committee Week, Tampa, Fla., Technical Contact:, Roger Blaine, Corvallis, Ore., Phone:, 302-559-6827; roger.l.blaine@gmail.com ASTM Staff Contact:, Scott Orthey, Phone: 610-832-9730; sorthey@astm.org, ASTM PR Contact:, Barbara Schindler, Phone: 610-832-9603; bschindl@astm.org Release #8893
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Proposed ASTM Kinetic Parameters Standard Being Developed by Hazard Potential of Chemicals CommitteeA proposed new standard being developed by ASTM International Committee E27 on Hazard Potential of Chemicals will provide needed reference materials for instruments, applications and software used for the evaluation of kinetic data used for hazard evaluation. The proposed new standard, ASTM WK27880 , Practice for Evaluation of Methods for Determination of Kinetic Parameters by Thermal Analysis,…, ASTM Committee E27 Next Meeting:, Nov. 15-17, November Committee Week, Tampa, Fla., Technical Contact:, Roger Blaine, Corvallis, Ore., Phone: 302-559-6827; roger.l.blaine@gmail.com, ASTM Staff Contact:, Scott Orthey, Phone: 610-832-9730; sorthey@astm.org, ASTM PR Contact:, Barbara Schindler, Phone: 610-832-9603; bschindl@astm.org Release #8611
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A newly approved ASTM International standard will advance the cause of architectural preservation. The new standard, ASTM C1713 , Specification for Mortars for the Repair of Historic Masonry, was developed by Subcommittee C12.03 on Specifications for Mortars, part of ASTM International Committee C12 on Mortars and Grouts for Masonry Units. John Wathne, structural engineer and president of…
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No industry standard currently exists that addresses the vacuum sealing requirements of knife-edged flanges for high vacuum applications. Existing international standards focus on interchangeability of the hardware, but do not address the reliability of the seal. ASTM International Committee E42 on Surface Analysis is now working on a proposed standard on the subject, WK21206 , Specification…
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A 2002 workshop on galling wear held by ASTM International Committee G02 on Wear and Erosion provided the impetus for the development of a new standard, ASTM G196 , Test Method for Galling Resistance of Material Couples. The new standard is under the jurisdiction of Subcommittee G02.40 on Non-Abrasive Wear. According to Scott Hummel, Ph.D., associate professor, head of the department of…
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A process hazard analysis prior to the startup of a chemical processing facility is essential to prevent catastrophic incidents due to thermal runaway reactions. A proposed new ASTM standard, WK9584, Guide for Assessing Potential Hazards of Synthesis Reactions Using Reaction Calorimetry, will help to standardize how the results from reaction calorimetry experiments are used in a process hazard…
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ASTM International Committee E42 on Surface Analysis has approved a new standard, E 2382, Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy. The guide, under the jurisdiction of Subcommittee E42.14 on STM/AFM, was proposed in order to assist new scanning probe microscopy users with more rapid recognition and assessment of artifacts in imaging…