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A 2002 workshop on galling wear held by ASTM International Committee G02 on Wear and Erosion provided the impetus for the development of a new standard, ASTM G196 , Test Method for Galling Resistance of Material Couples. The new standard is under the jurisdiction of Subcommittee G02.40 on Non-Abrasive Wear. According to Scott Hummel, Ph.D., associate professor, head of the department of…
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The market growth and wide acceptance of glass mat gypsum panels has led to the development and approval of a new ASTM International standard. C 1658/C 1658M , Specification for Glass Mat Gypsum Panels, is under the jurisdiction of Subcommittee C11.01 on Specifications and Test Methods for Gypsum Products, which is part of ASTM International Committee C11 on Gypsum and Related Building Materials…
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A new ASTM International standard that covers annular ball bearings intended primarily for use in instrument and precision rotating components has been developed as a conversion of a U.S. military standard, MIL-B-81793F, Annular Ball Bearings, for Instruments and Precision Rotating Components. The new standard, F 2332 , Specification for Annular Ball Bearings for Instruments and Precision…
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Although abuse-resistant gypsum panel products have been on the market for sometime, until recently, there was no standard way to evaluate or classify their various abuse-resistant properties. However, a new standard developed by ASTM International Committee C11 on Gypsum and Related Building Materials and Systems, now fills this need. The standard, C 1629, Classification for Abuse-Resistant…
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ASTM International Committee F34 on Rolling Element Bearings is seeking participation in a new activity on measuring the cleanliness and wetability of bearing components. Because aerospace customers currently use many different methods of testing ball bearings, the goal of the activity is to work toward a consistent method for measuring cleanliness and wetability, as well as to analyze the…
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ASTM International Committee E42 on Surface Analysis has approved a new standard, E 2382, Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy. The guide, under the jurisdiction of Subcommittee E42.14 on STM/AFM, was proposed in order to assist new scanning probe microscopy users with more rapid recognition and assessment of artifacts in imaging…