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ASTM International Committee E42 on Surface Analysis has approved a new standard, E 2382, Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy. The guide, under the jurisdiction of Subcommittee E42.14 on STM/AFM, was proposed in order to assist new scanning probe microscopy users with more rapid recognition and assessment of artifacts in imaging…
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ASTM International Subcommittee E54.03 on Decontamination has entered a rapid standards development effort since meeting in Kansas City in June 2004. The subcommittee benefited greatly during the meeting from the participation of a broad spectrum of stakeholders that represented private industry, military entities, government agencies (for example, Environmental Protection Agency and Department…