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ASTM International Committee E42 on Surface Analysis has approved a new standard, E 2382, Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy. The guide, under the jurisdiction of Subcommittee E42.14 on STM/AFM, was proposed in order to assist new scanning probe microscopy users with more rapid recognition and assessment of artifacts in imaging…
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ASTM International Committee E18 on Sensory Evaluation of Materials and Products has begun to develop a new proposed Guide for Panelist Feedback. The proposed standard will provide guidance on how to address various issues involved in delivering performance and information feedback to discrimination and descriptive/attribute testing panels. Information on the proposed guide, which is under the…