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ASTM International, one of the world’s leading standards organizations, announced today that its committee on commercial spaceflight ( F47 ) will hold its first official meeting May 8-9 at the Commercial Spaceflight Federation in Washington, D.C. “The commercial spaceflight industry is growing dramatically and driving innovation every day,” said ASTM International president Katharine Morgan. “…, Meeting Location:, Commercial Spaceflight Federation, 727 15th Street NW, Suite 800, Washington DC, USA, Media Inquiries:, Dan Bergels, tel +1.610.832.9602; dbergels@astm.org, ASTM Staff Contact:, Kristy Straiton, tel +1.610.832.9640; kstraiton@astm.org R elease #10290
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Yesterday, more than 50 government and industry officials decided to launch a new ASTM International committee dedicated to developing standards in the area of commercial spaceflight. The Committee on Commercial Spaceflight (F47) will focus on standards development in areas such as occupant safety of orbital and suborbital vehicles, launch and reentry vehicles, and spaceports. James Thomas,…, Media Inquiries:, Dan Bergels, tel +1.610.832.9602; dbergels@astm.org, ASTM Staff Contact:, Kristy Straiton, tel +1.610.832.9640; kstraiton@astm.org Release #10195
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No industry standard currently exists that addresses the vacuum sealing requirements of knife-edged flanges for high vacuum applications. Existing international standards focus on interchangeability of the hardware, but do not address the reliability of the seal. ASTM International Committee E42 on Surface Analysis is now working on a proposed standard on the subject, WK21206 , Specification…
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A 2002 workshop on galling wear held by ASTM International Committee G02 on Wear and Erosion provided the impetus for the development of a new standard, ASTM G196 , Test Method for Galling Resistance of Material Couples. The new standard is under the jurisdiction of Subcommittee G02.40 on Non-Abrasive Wear. According to Scott Hummel, Ph.D., associate professor, head of the department of…
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ASTM International Committee E42 on Surface Analysis has approved a new standard, E 2382, Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy. The guide, under the jurisdiction of Subcommittee E42.14 on STM/AFM, was proposed in order to assist new scanning probe microscopy users with more rapid recognition and assessment of artifacts in imaging…