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Open Meetings and One-Day Workshop in May, The National Institute of Advanced Industrial Science and Technology (AIST) in Japan has become the latest organization to sign a partnership agreement with ASTM International to develop a terminology standard for nanotechnology. AIST is an Independent Administrative Institution (IAI) in association with the Japanese Ministry of Economy, Trade and Industry (METI). AIST represents an amalgamation…, Partnerships Prove Beneficial, An early priority for the recently formed ASTM International Committee E56 on Nanotechnology is the development of a globally relevant, industry-driven terminology standard. In an effort to facilitate this objective, ASTM International has signed partnership agreements with the Institute of Electrical & Electronics Engineers (IEEE), the American Society of Mechanical Engineers (ASME), NSF…, Attendance Encouraged at Open Meetings and Workshop, Interested individuals are encouraged to attend the next meeting of Committee E56, which will take place May 16-18, 2005, in Reno, Nev., at the Hilton Reno Resort. Following the meetings, on May 19, at the same hotel, Committee E56 will cosponsor a Workshop on Characterization of Nanomaterials for Medical and Health Applications. The workshop will provide a structured venue to address critical…
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ASTM International, one of the largest voluntary standards development organizations in the world, announced the formation of a new committee to develop international consensus standards, definitions, terminology, and procedures covering nanotechnology. A branch of science and engineering that deals with things smaller than 100 nanometers (1 nm equals one-billionth of a meter), nanotechnology may…, An early priority for Committee E56 is the development of a globally relevant, industry-driven terminology standard for nanotechnology. In an effort to facilitate this objective, ASTM has signed partnership agreements with the Institute of Electrical & Electronics Engineers (IEEE), the American Society of Mechanical Engineers (ASME), and NSF International. These agreements focus solely on the…
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ASTM International Committee E42 on Surface Analysis has approved a new standard, E 2382, Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy. The guide, under the jurisdiction of Subcommittee E42.14 on STM/AFM, was proposed in order to assist new scanning probe microscopy users with more rapid recognition and assessment of artifacts in imaging…