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A 2002 workshop on galling wear held by ASTM International Committee G02 on Wear and Erosion provided the impetus for the development of a new standard, ASTM G196 , Test Method for Galling Resistance of Material Couples. The new standard is under the jurisdiction of Subcommittee G02.40 on Non-Abrasive Wear. According to Scott Hummel, Ph.D., associate professor, head of the department of…
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ASTM International Committee B05 on Copper and Copper Alloys has created a new task group, TG9018, which will be focused on the Antimicrobial Applications of Copper and Copper Alloys. The task group was formed following the U.S. Environmental Protection Agency's announcement of its registration of copper alloys as antimicrobial materials with specific health claims. According to James Michel,…
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An ASTM International task group on battery separator materials is currently working on the latest in a series of standards being developed for alkaline battery separators. The proposed new standard, WK13587 , Test Methods for Sampling and Testing Materials That Are Used for Alkaline Battery Separators, is under the jurisdiction of Subcommittee D09.19 on Dielectric Sheet and Roll Products, which…
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Two newly approved ASTM standards are filling a gap that has existed for tests for battery separators. The new standards, D 7129, Test Method for Determination of Ammonia Trapping in a Grafted Battery Separator, and D 7131, Test Method for Determination of Ion Exchange Capacity (IEC) in a Grafted Battery Separator, are under the jurisdiction of Subcommittee D09.19 on Dielectric Sheet and Roll…
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ASTM International Committee D09 on Electrical and Electronic Insulating Materials will host a presentation of the European Unions Restriction of Hazardous Substances (RoHS) Directive during their meeting in Philadelphia, Pa. on March 15. The meeting will run from 3:00 to 5:00 p.m. and will be followed by a social hour. Electrical equipment marketed in the EU after July 1, 2006, must comply…
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ASTM International Committee E42 on Surface Analysis has approved a new standard, E 2382, Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy. The guide, under the jurisdiction of Subcommittee E42.14 on STM/AFM, was proposed in order to assist new scanning probe microscopy users with more rapid recognition and assessment of artifacts in imaging…