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ASTM International Committee A06 on Magnetic Properties welcomes the participation of all stakeholders with an interest in the development of international standards for magnetic materials and magnetic properties. The committee will hold its biannual meeting this fall. ASTM Committee A06, which was formed in 1903, oversees approximately 50 standards dealing with magnetic materials and magnetic…, ASTM Staff Contact:, Kelly Paul, Phone: 610-832-9745; kpaul@astm.org, ASTM PR Contact:, Barbara Schindler, Phone: 610-832-9603; bschindl@astm.org Release #8975
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No industry standard currently exists that addresses the vacuum sealing requirements of knife-edged flanges for high vacuum applications. Existing international standards focus on interchangeability of the hardware, but do not address the reliability of the seal. ASTM International Committee E42 on Surface Analysis is now working on a proposed standard on the subject, WK21206 , Specification…
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A 2002 workshop on galling wear held by ASTM International Committee G02 on Wear and Erosion provided the impetus for the development of a new standard, ASTM G196 , Test Method for Galling Resistance of Material Couples. The new standard is under the jurisdiction of Subcommittee G02.40 on Non-Abrasive Wear. According to Scott Hummel, Ph.D., associate professor, head of the department of…
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ASTM International Committee A06 on Magnetic Properties has approved the first in a series of proposed standards on permanent magnet materials. The new standard, A 1054 , Specification for Sintered Ceramic Ferrite Permanent Magnets, as well as the other proposed standards, are under the jurisdiction of Subcommittee A06.02 on Material Specifications. While ASTM has long had standards covering…
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ASTM International Committee E42 on Surface Analysis has approved a new standard, E 2382, Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy. The guide, under the jurisdiction of Subcommittee E42.14 on STM/AFM, was proposed in order to assist new scanning probe microscopy users with more rapid recognition and assessment of artifacts in imaging…