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ASTM International, one of the largest voluntary standards development organizations in the world, announced the formation of a new committee to develop international consensus standards, definitions, terminology, and procedures covering nanotechnology. A branch of science and engineering that deals with things smaller than 100 nanometers (1 nm equals one-billionth of a meter), nanotechnology may…, An early priority for Committee E56 is the development of a globally relevant, industry-driven terminology standard for nanotechnology. In an effort to facilitate this objective, ASTM has signed partnership agreements with the Institute of Electrical & Electronics Engineers (IEEE), the American Society of Mechanical Engineers (ASME), and NSF International. These agreements focus solely on the…
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ASTM International, one of the largest voluntary standards development organizations in the world, today announced the formation of a new committee to develop standards for the evaluation of materials and products relative to the restriction of certain hazardous substances. Committee F40 on Declarable Substances in Materials will address issues that could have a devastating economic impact on…, Beginning the Standardization Process, On Oct. 15, 2004, representatives from the appliance, electric tool, electronic, laboratory, instrument manufacturing, and supplier sectors affected by RoHS legislation attended a planning meeting at ASTM International Headquarters. They agreed to hold an organizational meeting to discuss the creation of a new standardization activity on declarable substances. The organizational meeting occurred…, Participation Is Open, The development of standards within Committee F40 represents a chance to help the environment while constraining unnecessary compliance costs that may damage many sectors of the world economy. If you are part of the business sectors mentioned above, participation in F40 is in your economic interest. The next meeting of Committee F40 will take place May 26-27, 2005, at ASTM International…
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ASTM International Committee E42 on Surface Analysis has approved a new standard, E 2382, Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy. The guide, under the jurisdiction of Subcommittee E42.14 on STM/AFM, was proposed in order to assist new scanning probe microscopy users with more rapid recognition and assessment of artifacts in imaging…