The ASTM International Additive Manufacturing Center of Excellence (AM CoE) will hold its second Specialty Workshop Series on In-Situ Technology Readiness for Applications in AM Qualification and Certification, Jan. 26, 2022, in Huntsville, Alabama. The workshop will be held in collaboration with the U.S. National Aeronautics and Space Administration (NASA) Marshall Space Flight Center (MSFC).
In-situ monitoring technologies for additive manufacturing (AM) may be used as a means of controlling part quality, reducing ex-situ inspection requirements, and providing insights on elements of the AM value chain, including feedstock and design. Ultimately, in-situ technologies may provide a solution to quality assessment of components with complex geometries that are hard to inspect via traditional ex-situ inspection techniques.
Government, industry, and academic participants will meet to address relevant topics, including:
- Approaches to qualification using in-situ methods as a quality assurance tool in critical applications;
- Integrations of in-situ monitoring systems in production for real-time monitoring and closed-loop control; and
- Correlation of in-situ monitoring data to material defect states and process escapes, computational models, and traditional inspection techniques.
Due to COVID-19, the capacity of this event is limited. However, individuals may join the waitlist and available registrations will be confirmed by ASTM in early December.
For workshop information or questions, please contact the AM CoE at amcoe-research@astm.org.
Formed in 2018, the AM CoE is a collaborative partnership among ASTM International and representatives from industry, governments, and academia, that conduct strategic R&D to advance standards across all aspects of AM technologies. The center aims to accelerate the development and adoption of robust, game-changing technologies by leveraging training programs, standardization, and certification-related offerings.
For more on the work of the AM CoE, visit www.amcoe.org.
Media Inquiries: Dan Bergels, tel +1.610.832.9602; dbergels@astm.org
Release #11337
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